Mahr - Product Catalog Page 664
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MarSurf WI 50 3D surface measurement DESCRIPTION The flexible, all-round measuring solution The MarSurf WI 50 is a compact white light interferometer for the three-dimensional measurement and analysis of surfaces – contactless, independent of material, and fast. Allrounder-measurement solutions, flexible at all times, exactly where it comes down to the sub-nanometer: this is what the new MarSurf WI 50 stand for. These high-precision measurement tools for research and quality assurance deliver reliable 3D measuring data – quickly and straightforward in very few steps. Key benefits: • measuring speed – even at full resolution • CNC-functionalitiy for all axes • Safety through collision detection in all directions to protect your workpiece and measuring system • High Dynamic Range (HDR) function, 16-bit • HD-stitching: Consistent high resolution output of large measuring surfaces This established optical measuring system is successfully used, for example, for: • Roughness measurement according to DIN EN ISO 4287 / 25178 • Topography measurement (including volume, wear, isotropy) • Measurement of microgeometry and layer thicknesses • Users value the reliability of this measuring system, which provides quantitative, traceable 3D characteristics for many industries Supplied with: MarSurf WI 50 • Interferometric measuring head – HDR camera (2 MP or 5 MP) – 4x lens revolver with identification • L-tripod including control electronics • Motorized XY table (50 x 50 mm) with glass scales for sample positioning and image field merging (“stitching”) • Motorized Z-axis (70 mm) with glass measuring scale • Measuring system computer with 24” TFT monitor • Objective lenses: – 2.5x to 100x selectable • MarSurf MSW for intuitive data acquisition • MarSurf MfM for professional evaluation, graphical representation and creation of measuring records (choice of Standard, Extended or Premium version) 26 TECHNICAL DATA WI 50 Measuring principle Resolution White Light Interferometer High-performance LED (650 nm / white) up to 0.2 (nm) vertical Measuring speed Surface parameters up to 140 fps ISO 4287, ISO 13565, ISO 25178 … APPLICATION: • Mechanical Engineering To qualify and quantify roughness, geometry and wear volume • Electronics and semiconductors Component inspection down to the sub-micrometer range for defect-free products • Medical Technology Quality assurance of medical surfaces in production and laboratory • Material Science Optimization of functional properties of new surfaces and products • Microsystems Technology Measure complex surface geometries of smallest components with nanometer precision For more information, please visit our website: www.mahr.com Mahr | Supplementary Catalog 2020 / 2021
708 Pages | Valid until 12/2023 | Previous page | Next page
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